Home // ADVCOMP 2014, The Eighth International Conference on Advanced Engineering Computing and Applications in Sciences // View article
Reusable Modeling of Diagnosis Functions for Embedded Systems
Authors:
Shingo Nakano
Tatsuya Shibuta
Masatoshi Arai
Noriko Matsumoto
Norihiko Yoshida
Keywords: Embedded System Diagnoses; Aspect-Oriented Systems
Abstract:
This paper presents a technique to embed diagnosis functions in model-based design of embedded systems, allowing designers to do this at early design stages, before separation of hardware and software (HW/SW) implementations and derivation of several variations. First, we develop some simple monitoring functions suitable for both HW/SW based on JTAG (Joint Test Action Group). Then, in order to identify faulty components in a complex embedded systems where a fault in a component can affect others, we employ a method proposed by Kutsuna et al., which is based on ``model-based diagnosis'' studied in the field of Artificial Intelligence. This paper uses MATLAB/Simulink as a modeling framework, and employs aspect-oriented approach for diagnosis description to promote reuse of diagnosis function models. This method enables to locate a fault source even if the fault propagates multiple modules.
Pages: 12 to 17
Copyright: Copyright (c) IARIA, 2014
Publication date: August 24, 2014
Published in: conference
ISSN: 2308-4499
ISBN: 978-1-61208-354-4
Location: Rome, Italy
Dates: from August 24, 2014 to August 28, 2014