Home // CENICS 2014, The Seventh International Conference on Advances in Circuits, Electronics and Micro-electronics // View article

Simultaneous Measurement of Temperature and Expansion on Radio Frequency Power Electronic Components

Authors:
Eric Joubert
Olivier Latry
Jean-Philippe Roux

Keywords: thermal measurement; laser; electronic components.

Abstract:
This paper presents a new approach for measuring physical variables on micro-electronic components. An optical system is used to simultaneously quantify the surface temperature of a component and its expansion. This double acquisition is achieved by a Michelson interferometer coupled with a Charge Coupled Device (CCD) line device. To validate this method, the temperature measurements were directly compared with the results obtained by an infrared camera and by a measurement of variation of I(V). The displacement measurements were compared with those obtained by a laser 3D vibrometer, whose physical principle is completely different. Consistent results were obtained regarding the different techniques.

Pages: 7 to 10

Copyright: Copyright (c) IARIA, 2014

Publication date: November 16, 2014

Published in: conference

ISSN: 2308-426X

ISBN: 978-1-61208-379-7

Location: Lisbon, Portugal

Dates: from November 16, 2014 to November 20, 2014