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Soft Errors Mask Analysis on Program Level

Authors:
Lei Xiong
Qingping Tan
Jianjun Xu

Keywords: soft errors; error mask; fault tolerance; control flow; dynamically dead codes

Abstract:
Computer hardware which consist billions of transistors could fail because of soft errors with the improving of semiconductor technology, and these failure could result in incorrect program execution. However, soft errors could be masked. Most methods of SIFT (Software-Implemented Fault Tolerance) do not take mask into account. In fact, these parts of program which could mask soft errors don’t need to be added redundancy instructions with SIFT methods. These parts of program are analyzed in this paper. We equal logical errors of soft errors to errors in program. In our analysis, we focus on two parts of program. One is idle program which is related to control flow. The probability for them to be executed is low. The other is dynamically dead codes. From static view, dynamically dead codes include statically dead codes and statically partial dead codes. By control flow graph, we analyze the condition which could mask soft errors of these parts of program. Finally, we design an experimental framework to demonstrate our analysis. Those codes which we analyze show their ability to mask soft errors.

Pages: 449 to 454

Copyright: Copyright (c) IARIA, 2011

Publication date: January 23, 2011

Published in: conference

ISSN: 2308-4413

ISBN: 978-1-61208-113-7

Location: St. Maarten, The Netherlands Antilles

Dates: from January 23, 2011 to January 28, 2011