Home // ICONS 2019, The Fourteenth International Conference on Systems // View article

Development of Extended-STIL Pattern Compiler for Test Programming Environment

Authors:
Seong-Jin Kim
Kwang-Man Ko

Keywords: STIL pattern compiler; Standard test interface language; test pattern

Abstract:
In this paper, we extended the blocks that can generate analog signals in the AC Instrument board along with the basic blocks provided by the STIL standard. We developed a compiler that extracts test information by analyzing STIL files by block. In order to verify the accuracy of the test information extracted by the compiler, experimental results using ATE are presented.

Pages: 39 to 44

Copyright: Copyright (c) IARIA, 2019

Publication date: March 24, 2019

Published in: conference

ISSN: 2308-4243

ISBN: 978-1-61208-696-5

Location: Valencia, Spain

Dates: from March 24, 2019 to March 28, 2019