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Advanced Object Oriented Metrics for Process Measurement

Authors:
Shreya Gupta
Ratna Sanyal

Keywords: Mood Metrics; Attribute Inheritance Factor; Method Inheritance Factor; Attribute Hiding Factor; Method Hiding Factor.

Abstract:
Process improvement requires measurement of specific attributes of process. Measurement of a process gives us a clear insight into the system. It provides effective ways of estimation and evaluation. Then, it is essential to develop a set metrics covering the attributes. Computed measures are used as indicators for process improvement areas. These indications if incorporated into the software development, will lead to development of an effective and reliable system. Mood metrics has defined some indicators for inheritance like Attribute Inheritance Factor (AIF), Method Inheritance Factor (MIF), and for hiding are Attribute Hiding Factor (AHF), Method Hiding Factor (MHF). We are proposing extensions to these metrics. These extensions are more specific and give a better hint towards inheritance and hiding properties.

Pages: 318 to 324

Copyright: Copyright (c) IARIA, 2011

Publication date: October 23, 2011

Published in: conference

ISSN: 2308-4235

ISBN: 978-1-61208-165-6

Location: Barcelona, Spain

Dates: from October 23, 2011 to October 29, 2011