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FITness Assessment - Hardware Algorithm Safety Validation

Authors:
Andreas Strasser
Philipp Stelzer
Christian Steger
Norbert Druml

Keywords: lidar safety; lidar component reliability; ecc; algorithm validation

Abstract:
Error Correction Codes (ECC) are important safety methods for digital data to gain control of Single Event Upsets (SEU) in integrated digital circuits. SEU are responsible for single bit flips inside a digital circuit caused by ionizing radiation. This effect does not affect the physical structure of the components but the correctness of data inside flip flops. Consequently, data gets corrupted and the correct program flow gets disturbed. This effect needs to be considered especially for safety-critical systems. In the new ISO 26262 2nd Edition, the automotive domain suggests controlling SEU effects by algorithms that correct Single Bit Errors and Detect Double Bit Errors (SEC-DED). This raises the question what kind of impact Double Bit Error Correction (DEC) will have on the overall safety level for LiDAR systems. In this paper we determine the difference between two ECC algorithms from a safety point of view: Hamming’s code (SEC-DED) and BCH-code (DEC). For this purpose we developed a novel method for algorithm safety validation and applied it to both algorithms.

Pages: 12 to 17

Copyright: Copyright (c) IARIA, 2019

Publication date: March 24, 2019

Published in: conference

ISSN: 2308-3700

ISBN: 978-1-61208-698-9

Location: Valencia, Spain

Dates: from March 24, 2019 to March 28, 2019