Home // SECURWARE 2016, The Tenth International Conference on Emerging Security Information, Systems and Technologies // View article
Authors:
Milan Navratil
Vojtech Kresalek
Adam Koutecky
Zdenek Malanik
Keywords: forensic balistic; scanning probe microscopy; firing pin; cartridge case; marks; 3D; topography
Abstract:
In spite of the significance of tool mark analysis in forensic ballistics, the image acquisition and comparison of tool marks remains a difficult and time consuming effort. This work deals with modified scanning probe microscopy applied to examination of marks on the surface of fired cartridge cases. Marks after firing pin are represented by 3-D topography image from measured data and compared according to images taken from confocal microscope and scanning electron microscope.
Pages: 45 to 50
Copyright: Copyright (c) IARIA, 2016
Publication date: July 24, 2016
Published in: conference
ISSN: 2162-2116
ISBN: 978-1-61208-493-0
Location: Nice, France
Dates: from July 24, 2016 to July 28, 2016