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RMDM – A Conceptual ICT Risk-Meta-Data-Model - Applied to COBIT for Risk as underlying Risk Model

Authors:
Martin Latzenhofer
Gerald Quirchmayr

Keywords: information and communication technology risk management; ICT risk-meta-data-model; COBIT for Risk; metamodeling; data model; UML

Abstract:
The aim of this article is to introduce an approach that integrates the different models and methods currently applied for risk management in information and communication technologies (ICT). These different risk management approaches are usually bound to the organization where they are applied, thus staying quite specific for a given setting. Consequently, there is no possibility to compare or reuse risk management structures because they are individual solutions. In order to establish a common basis for working with different underlying risk models, a metamodeling approach from the area of Disaster Recovery is used. A first concept for a data model described in Unified Modeling Language (UML) is presented and its core components addressing the whole risk management lifecycle are described. This contribution describes a comprehensive mapping of information artefacts – in this case obtained from the COBIT for Risk framework – which are then lifted to the meta-level of the proposed ICT risk-meta-data-model in order to be able to work with them in a consolidated way. Through this mapping process, all information artefacts are extracted, consolidated and harmonized to minimize the number of relevant objects. It has turned out that both the list of consolidated objects and the derived describing attributes can in general be incorporated into the proposed ICT risk-meta-data-model (RMDM), i.e., the essential information for working with the COBIT for Risk model can be stored in the proposed ICT risk-meta-data-model. The results of the mapping show that it is worth examining a data-structure-oriented approach in order to develop both a model and a data structure for further framework-independent processing.

Pages: 117 to 124

Copyright: Copyright (c) IARIA, 2017

Publication date: September 10, 2017

Published in: conference

ISSN: 2162-2116

ISBN: 978-1-61208-582-1

Location: Rome, Italy

Dates: from September 10, 2017 to September 14, 2017