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Magnetic Flux Leakage Testing for Back-side Defects Using a Tunnel Magnetoresistive Device

Authors:
Yuya Tsukamoto
Keisyu Shiga
Kenji Sakai
Toshihiko Kiwa
Keiji Tsukada
Yasuhiro Honda

Keywords: magnetic imaging; TMR device; Low-Freaquency field; back-side pit

Abstract:
Magnetic non-destructive testing is limited to surface inspection, however demand for the detection of deep defects is increasing. Therefore, we developed a magnetic flux leakage (MFL) system using a tunnel magnetoresistive (TMR) device that has high sensitivity and wide frequency range in order to detect deep defects. Using the developed system, back-side pits of steel plates having different depth and diameter were measured and 2D images were created. Moreover, we analyzed the detected vector signal with optimized phase data. As a result, the developed MFL system can detect a defect that has a wall thinning rate of more than 56 % of 8.6 mm thick steel plates. Furthermore, the defect’s diameter size was estimated by spatial signal change.

Pages: 114 to 118

Copyright: Copyright (c) IARIA, 2014

Publication date: November 16, 2014

Published in: conference

ISSN: 2308-3514

ISBN: 978-1-61208-375-9

Location: Lisbon, Portugal

Dates: from November 16, 2014 to November 20, 2014