Home // International Journal On Advances in Systems and Measurements, volume 8, numbers 1 and 2, 2015 // View article
Authors:
Tara Astigarraga
Yoram Adler
Orna Raz
Robin Elaiho
Sheri Jackson
Jose Roberto Mosqueda Mejia
Keywords: Keywords - Software Test; SAN Coverage; SAN Architecture Coverage; SAN Architectural Modeling; Software Engineering; SAN Test; System Test; Distance Matrix; Trace Coverage Models; SAN Hardware Test Coverage; Test Coverage Analysis; IBM Test; IBM Systems T
Abstract:
Abstract - Storage Area Networks (SAN) architectural solutions are highly complex, often with enterprise class quality requirements. To perform end-to-end customer-like SAN testing, multiple complex interoperability test labs are necessary. One key factor in field quality is test coverage; in distributed test environments this requires a centralized view and coverage model across the different areas of test. We define centralized coverage models and apply our novel trace coverage technology to automatically populate these models. Early results indicate that we are able to create a centralized view of SAN architectural coverage across the multitude of IBM test labs world-wide. Moreover, we are able to compare test lab coverage models with customer environments. Since its inception, this distance matrix project has shown added value in many foreseen and unforeseen ways. The largest benefit of this project is the ability to systematically extract and model coverage across a large number of test and client SAN environments, enabling increased coverage without expanding resource requirements or timelines. One of the key success factors for this model is its scalability. The scalability and reach of the distance matrix project has also uncovered additional unforeseen benefits and efficiencies. As the project matures we continue to see improvements, new capabilities, use case extensions and scaled architectural coverage advances.
Pages: 103 to 112
Copyright: Copyright (c) to authors, 2015. Used with permission.
Publication date: June 30, 2015
Published in: journal
ISSN: 1942-261x