Home // VALID 2014, The Sixth International Conference on Advances in System Testing and Validation Lifecycle // View article

IBM SAN Distance Matrix Project

Authors:
Yoram Adler
Tara Astigarraga
Sheri Jackson
Jose Roberto Mosqueda Mejia
Orna Raz

Keywords: Software Test; Software Engineering; SAN Test; System Test; Distance Matrix; Trace Coverage Models; SAN Hardware Test Coverage

Abstract:
Storage Area Networks (SAN) solutions are highly complex, often with enterprise class quality requirements. To perform end-to-end customer-like SAN testing, multiple complex interoperability test labs are necessary. One key factor in field quality is test coverage; in distributed test environments this requires a centralized view and coverage model across the different areas of test. We define centralized coverage models and apply our novel trace coverage technology to automatically populate these models. Early results indicate that we are able to create a centralized view of SAN coverage across the multitude of IBM test labs worldwide. Moreover, we are able to compare test lab coverage models with customer environments. Based on these views and comparisons, we expect to obtain an increased coverage, resulting in increased discovery rate of high-impact defects.

Pages: 84 to 87

Copyright: Copyright (c) IARIA, 2014

Publication date: October 12, 2014

Published in: conference

ISSN: 2308-4316

ISBN: 978-1-61208-370-4

Location: Nice, France

Dates: from October 12, 2014 to October 16, 2014