VALID 2016, The Eighth International Conference on Advances in System Testing and Validation Lifecycle

Type: conference

Notes: IARIA Conference.

Editors:
Xinli Gu, Huawei Technologies Co., Ltd., USA
Claus-Peter Rückemann, Leibniz Universität Hannover / Westfälische Wilhelms-Universität Münster / North-German Supercomputing Alliance (HLRN), Germany

ISSN: 2308-4316

ISBN: 978-1-61208-500-5

Location: Rome, Italy

Dates: from August 21, 2016 to August 25, 2016

Articles: there are 4 articles

Automatic Job Generation for Compiler Testing
Ludek Dolihal and Tomas Hruska
keywords: Compiler testing; Continuous integration; Hardware/Software codesign; Test generation.

SAT-Based Testing of Diagnosability and Predictability of Centralized and Distributed Discrete Event Systems
Hassan Ibrahim, Philippe Dague, and Laurent Simon
keywords: Diagnosability, Predictability, SAT, DES, DDES

Automatic Test Evaluation for Driving Scenarios Using Abstraction Level Constraints
Steffen Wittel, Daniel Ulmer, and Oliver Bühler
keywords: Automotive Testing; Test Generation; Test Evaluation; Test Automation

Anomaly-Detection-Based Failure Prediction in a Core Router System
Shi Jin, Zhaobo Zhang, Gang Chen, Krishnendu Chakrabarty, and Xinli Gu
keywords: Anomaly Detection; Failure Prediction; SVM