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Simulated Injection of Radiation-Induced Logic Faults in FPGAs

Authors:
Cinzia Bernardeschi
Luca Cassano
Andrea Domenici
Giancarlo Gennaro
Mario Pasquariello

Keywords: SRAM-FPGA; Simulation; Single Event Upset; Single Event Transient; Stochastic Activity Networks

Abstract:
SRAM-FPGA systems are simulated with a model based on the Stochastic Activity Networks (SAN) formalism. Faults are injected into the model and their propagation is traced to the output pins using a four-valued logic that enables faulty logical signals to be tagged and recognized without recurring to a comparison with the expected output values. Input vectors are generated probabilistically based on assumed signal probabilities. By this procedure it is possible to obtain a statistical assessment of the observability of different faults for the generated inputs. The analysis of a 2-out-of-2 voter is shown as a case study.

Pages: 84 to 89

Copyright: Copyright (c) IARIA, 2011

Publication date: October 23, 2011

Published in: conference

ISSN: 2308-4316

ISBN: 978-1-61208-168-7

Location: Barcelona, Spain

Dates: from October 23, 2011 to October 29, 2011