VALID 2011, The Third International Conference on Advances in System Testing and Validation Lifecycle

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Type: conference

Notes: IARIA Conference.

Editors:
Teemu Kanstrén, VTT Technical Research Centre of Finland - Oulu, Finland

ISSN: 2308-4316

ISBN: 978-1-61208-168-7

Location: Barcelona, Spain

Dates: from October 23, 2011 to October 29, 2011

Articles: there are 21 articles

Using Assertion-Based Testing in String Search Algorithms
Ali Alakeel and Mahmoud Mhashi
keywords: Software testing; Assertion-Based Testing; Program Assertions; String Search Algorithms

An Approach to Modularization in Model-Based Testing
Teemu Kanstrén, Olli-Pekka Puolitaival, and Juho Perälä
keywords: model based testing, test automation, modularization

Dealing with Challenges of Automating Test Execution
Vitalina Turlo and Valery Safronau
keywords: Desktop application testing; survey; industrial experience; integration of testing tools; automated testing control solution.

Detecting Equivalent Mutants by Means of Constraint Systems
Simona Nica, Mihai Nica, and Franz Wotawa
keywords: Mutation Testing; Equivalent Mutants; Mutation Score; Constraint Satisfaction Problem; Distinguishing Test Case.

Answer-Set Programming as a new Approach to Event-Sequence Testing
Esra Erdem, Katsumi Inoue, Johannes Oetsch, Jörg Pührer, Hans Tompits, and Cemal Yilmaz
keywords: event-sequence testing, combinatorial interaction testing, answer-set programming

A Test Case Suite Generation Framework of Scenario Testing
Ting Li, Zhenyu Liu, and Xu Jiang
keywords: test case; software test; scenario testing; test suite

Is Mutation Testing Scalable for Real-World Software Projects?
Simona Nica, Rudolf Ramler, and Franz Wotawa
keywords: mutation testing; mutation tools; coverage tools; eclipse project;

Testing As A Service for Component-based Developments
Hien Le
keywords: software components; component testing; testing as a service

A Zone-based Reachability Analysis of Variable Driven Timed Automata
Omer Nguena-Timo and Antoine Rollet
keywords: reachability analysis, zone, timed systems, data-flow, urgent edges.

Retrospective Project Analysis Using the Expectation-Maximization Clustering Algorithm
Steffen Herbold, Jens Grabowski, and Stephan Waack
keywords: EM clustering, project analysis, repository mining

Extracting and Verifying Viewpoints Models in Multitask Applications
Selma Azaiez, Belgacem Benhedia, and Vincent David
keywords: multitask applications; semantic-based static; analysis; property verification; property analysis pattern; model extraction pattern

Requirements and Solutions for Tool Integration in Software Test Automation
Bernhard Peischl, Rudolf Ramler, Thomas Ziebermayr, Stefan Mohacsi, and Christoph Preschern
keywords: software test tools; test automation framework; application integration

RobusTest: Towards a Framework for Automated Testing of Robustness in Software
Ali Shahrokni and Robert Feldt
keywords: Robustness, real time systems, testing, timing

Simulated Injection of Radiation-Induced Logic Faults in FPGAs
Cinzia Bernardeschi, Luca Cassano, Andrea Domenici, Giancarlo Gennaro, and Mario Pasquariello
keywords: SRAM-FPGA; Simulation; Single Event Upset; Single Event Transient; Stochastic Activity Networks

Concurrent Engineering used to Implement Risk & Hazard Control
Gheorghe Florea and Luiza Ocheana
keywords: SIS; Redundancy; Remote intervention; Simulation; Diagnostics; Hierarchical decision; Concurrent engineering; Risk and hazard assessment

Model Reconstruction: Mining Test Cases
Edith Werner and Jens Grabowski
keywords: Machine Learning, Reverse Engineering, Testing

Generic Data Format Approach for Generation of Security Test Data
Christian Schanes, Florian Fankhauser, Stefan Taber, and Thomas Grechenig
keywords: Software testing; Computer network security; Fuzzing

A Classification for Model-Based Security Testing
Michael Felderer, Berthold Agreiter, Philipp Zech, and Ruth Breu
keywords: Secure Systems, Verification and Testing, Security Testing, Model-based Testing

Utilizing Domain-Specific Modelling for Software Testing
Olli-Pekka Puolitaival, Teemu Kanstrén, Veli-Matti Rytky, and Asmo Saarela
keywords: domain-specific modellin; test automation

Comparison of off-chip interconnect validation to field failures
Michael Shepherd, David Blankenbeckler, and Adam Norman
keywords: DDR, DRAM, memory, bus margin

Software Testing in Critical Embedded Systems: a Systematic Review of Adherence to the DO-178B Standard
Jacson Rodrigues Barbosa, Márcio Eduardo Delamaro, José Carlos Maldonado, and Auri Marcelo Rizzo Vincenzi
keywords: software testing; critical embedded system; DO-178B