VALID 2017, The Ninth International Conference on Advances in System Testing and Validation Lifecycle
Type: conference
Notes: IARIA Conference.
Editors:
Xinli Gu, Huawei Technologies Co., Ltd., USA
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Claus-Peter Rückemann, Leibniz Universität Hannover / Westfälische Wilhelms-Universität Münster / North-German Supercomputing Alliance (HLRN), Germany
ISSN: 2308-4316
ISBN: 978-1-61208-593-7
Location: Athens, Greece
Dates: from October 8, 2017 to October 12, 2017
Articles: there are 3 articles
A Method to Determine the Static NBTI Stress Time of an Embedded Component in an Integrated Circuit