VALID 2018, The Tenth International Conference on Advances in System Testing and Validation Lifecycle

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Type: conference

Notes: IARIA Conference.

Editors:
Jos van Rooyen, Identify - Software Quality Services, the Netherlands

ISSN: 2308-4316

ISBN: 978-1-61208-671-2

Location: Nice, France

Dates: from October 14, 2018 to October 18, 2018

Articles: there are 3 articles

System Debug and Validation: Use case Based Perspective
Bhushan Naware, Arun Pai, and Ravinder Singh
keywords: Test Plan; Use case; Scenario; Win-DBG; JTAG; Silicon Debug

Learning to Categorize Bug Reports With LSTM Networks
Kaushikkumar D. Gondaliya, Jan Peters, and Elmar Rueckert
keywords: classification of text; bug reports; natural language processing; long short term memory networks; support vector machines.

Improving Testability of Software Systems that Include a Learning Feature
Lydie du Bousquet and Masahide Nakamura
keywords: Learning System; Validation; Testability; Design for Testing