VALID 2015, The Seventh International Conference on Advances in System Testing and Validation Lifecycle

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Type: conference

Notes: IARIA Conference.

Editors:
Teemu Kanstren, VTT, Finland
Birgit Gersbeck-Schierholz, Leibniz Universität Hannover, Germany

ISSN: 2308-4316

ISBN: 978-1-61208-441-1

Location: Barcelona, Spain

Dates: from November 15, 2015 to November 20, 2015

Articles: there are 7 articles

An Experimental Comparative Study of Fault-Tolerant Architectures
Imran Wali, Arnaud Virazel, Alberto Bosio, and Patrick Girard
keywords: fault tolerant architecture; fault tolerance capability assessment

Mobile Application Validation through Virtualization
Cyril Dumont, Steven Enten, Fabrice Mourlin, and Laurent Nel
keywords: embedded device; firmware custom; monitoring; virtualization; state management.

Variability in Test Systems: Review and Challenges
Aitor Arrieta, Goiuria Sagardui, and Leire Etxeberria
keywords: Test Systems; Test Architecture; Variability; Validation

Automatic Test Set Generator with Numeric Constraints Abstraction for Embedded Reactive Systems: AUTSEG V2
Mariem Abdelmoula, Daniel Gaffé, and Michel Auguin
keywords: Test Sets; Synchronous Model; Pre-conditions; Numeric Data Processing; Backtrack; AUTSEG V2; SupLDD

Identifying Error-prone Transactions in Enterprise Applications
Pavan Kumar Chittimalli, Sachin Patel, and Vipul Shah
keywords: Enterprise Application testing; BPMN; Stastical Bug Isolation; Bug Localization

Automatic Falsification of Java Assertions
Rafael Caballero, Manuel Montenegro, Herbert Kuchen, and Vincent Von Hof
keywords: assertion; automatic test-case generation; program transformation

RDTA – Repository Driven Test Automation A new look into reuse of test automation artifacts
Dani Almog, Hadas Chassidim, Shlomo Mark, and Yaron Tsubary
keywords: testing; test automation; software reuse; repository driven automation