Home // VALID, International Conference on Advances in System Testing and Validation Lifecycle
Type: conference
ISSN: 2308-4316
Notes: IARIA Conference.
Editions: - there are 15 editions.
- VALID 2011, The Third International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2012, The Fourth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2013, The Fifth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2014, The Sixth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2015, The Seventh International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2016, The Eighth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2017, The Ninth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2018, The Tenth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2019, The Eleventh International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2020, The Twelfth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2021, The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2022, The Fourteenth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2023, The Fifteenth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2024, The Sixteenth International Conference on Advances in System Testing and Validation Lifecycle
- VALID 2025, The Seventeenth International Conference on Advances in System Testing and Validation Lifecycle