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CENICS 2012, The Fifth International Conference on Advances in Circuits, Electronics and Micro-electronics
Type: conference
Notes: IARIA Conference
Editors:
Sergey Yurish, IFSA - Barcelona, Spain
Pascal Lorenz, University of Haute Alsace, France
ISSN: 2308-426X
ISBN: 978-1-61208-213-4
Location: Rome, Italy
Dates: from August 19, 2012 to August 24, 2012
Articles: there are 9 articles
A 2.45 GHz CMOS Voltage Controlled Ring Oscillator for Active Transponder
Jubayer Jalil, Mamun Bin Ibne Reaz, Labonnah Farzana Rahman, Mohammad Marufuzzaman, and Mohammad Syedul Amin
keywords: VCRO; RFID; Transponder; CMOS; Differential
Novel High-Speed and Ultra-Low-Voltage CMOS NAND and NOR Domino Gates
Yngvar Berg and Omid Mirmotahari
keywords: Low-Voltage, High-Speed, NAND2, NOR2, CMOS, Floating-Gate
A Novel High Speed Differential Ultra Low-Voltage CMOS Flip-Flop for High Speed Applications
Yngvar Berg
keywords: CMOS, low-voltage, Flip-Flop, High-Speed, Floating-Gate
Integration of Design Space Exploration into System-Level Specification Exemplified in the Domain of Embedded System Design
Falko Guderian and Gerhard Fettweis
keywords: embedded system design; system-level design; executable specification; design space exploration
Unsupervised Image Segmentation Circuit Based on Fuzzy C-Means Clustering
Wen-Jyi Hwang, Zhe-Cheng Fan, and Tsung-Mao Shen
keywords: FPGA; Image Segmentation; Unsupervised Clustering; System-on-Chip
Various Discussions and Improvements of Voltage Equalizer for EDLCs Including Secondary Batteries
Keiju Matsui, Kouhei Yamakita, and Masaru Hasegawa
keywords: EDLC, Voltage Equalizer, Secondary Battery, Cockcroft-Walton, Buck-boost
ASIP for Multi-Standard Video Decoding
Jae-Jin Lee, KyungJin Byun, and NakWoong Eum
keywords: multimedia processor, application-specific instruction processor, video decoding
New Design Approach of an FIR Filters Based FPGA-Implementation for a Bio-Inspired Medical Hearing Aid
Lotfi Bendaouia, Si Mahmoud Karabernou, Lounis Kessal, Hassen Salhi, and Fayçal Ykhlef
keywords: Hearing aid; DWT; FIR; area; area; Latency; Power consumption
Reliable CMOS VLSI Design Considering Gate Oxide Breakdown
Kyung Ki Kim
keywords: TDDB; Reliability; Gate oxide breakdown; Time dependent dielectric breakdown; Aging effect